RIGOL DSG836-OCXO: Precision RF Signal Generation from 9kHz to 3GHz

Features and Specifications: RIGOL DSG836-OCXO RF Signal Generator

Product Overview:

The RIGOL DSG836-OCXO RF Signal Generator is a high-performance instrument designed for demanding applications in wireless communications, aerospace, and defense. With its exceptional frequency range, resolution, and stability, the DSG836-OCXO delivers precise and reliable signal generation for testing and validation purposes.

Features:

Frequency range: 9 kHz to 3 GHz
Frequency resolution: 0.01 Hz
Output power: -130 dBm to +20 dBm
Modulation types: AM, FM, PM, ASK, FSK, PSK, QAM
OCXO clock for exceptional frequency stability
Large, high-resolution color display
Intuitive user interface
Remote control via USB, LAN, or GPIB

Specifications:

Frequency accuracy: ±1 ppm
Frequency stability: ±0.5 ppm/year
Output impedance: 50 ohms
Harmonic distortion: <-60 dBc
Spurious emissions: <-80 dBc
Phase noise: <-120 dBc/Hz @ 10 kHz offset

What’s in the Box:

RIGOL DSG836-OCXO RF Signal Generator
Power cord
USB cable
Quick start guide

Benefits:

Exceptional frequency range and resolution: Enables testing of a wide range of devices and applications.
High stability OCXO clock: Ensures accurate and reliable signal generation over extended periods.
Comprehensive modulation capabilities: Supports a variety of modulation types for testing different communication protocols.
Intuitive user interface: Simplifies operation and reduces setup time.
* Remote control options: Allows for integration into automated test systems.

Value to the Customer:

The RIGOL DSG836-OCXO RF Signal Generator provides exceptional performance and versatility for demanding RF testing applications. Its high frequency range, resolution, and stability make it an ideal choice for testing wireless devices, radar systems, and other critical components. The intuitive user interface and remote control options enhance productivity and efficiency, while the comprehensive modulation capabilities support a wide range of testing scenarios.