Introducing the Ralston Instruments QTHP1000 QTFIT, the ultimate solution for precise and efficient quantitative thin-film analysis. Unlike other systems, our QTFIT combines advanced X-ray diffraction (XRD) and X-ray reflectometry (XRR) techniques, providing unparalleled accuracy and versatility. With its user-friendly interface and comprehensive software suite, the QTHP1000 QTFIT empowers researchers and engineers to analyze thin films with unmatched precision and ease.